Figure 1From: Methodologies to generate, extract, purify and fractionate yeast ECM for analytical use in proteomics and glycomics Overlays of S. cerevisiae and C. albicans cultures. Longitudinal cuts of overlays of cultures of S. cerevisiae and C. albicans grown for 7 and 5 days, respectively, on YPD at 30°C. Micrographs were obtained with a Leica Microsystems DM-RB fluorescence microscope and uEye digital camera.Back to article page