Characterization of ZnO, TiO
, or SiO
nanoparticles by transmission electron microscopy (TEM). Nanoparticles were deposited on formvar carbon coated grids and dried for TEM imaging. Images were analyzed in high resolution mode with an acceleration voltage of 100 kV. Morphology of ZnO, TiO2 or SiO2 is shown in left, middle and right of the above images. Scale Bar = 20 nm.